Make impedance movement visible
A Smith chart helps turn complex reflection data into a visual tuning path.
- Plot S11 and S22 movement
- Inspect frequency markers
- Compare matching changes
- Keep Smith and rectangular plots connected
Smith chart
Smith chart inspection and RF matching
Use Smith chart views to inspect impedance trajectories, S-parameter behavior, return loss, matching targets, and component tuning effects.
Smith chartimpedancematchingreturn lossS11S22
View
complex impedance
Use
matching
Linked
RF measurements
Schematic
Capture, ports, labels, reusable sheets, and touch-friendly editing.
Plots
Waveforms, measurements, markers, RF traces, and tuning feedback.
RF
S-parameters, return loss, insertion loss, Smith chart, gain, and stability.
Tuner
Tune components and compare response changes without leaving the workspace.
Designed for tuning, not decoration
The Smith chart is part of the measurement workflow, not a standalone calculator isolated from the circuit.
- Start from the RF workspace
- Use target-frequency markers
- Tune component values
- Compare response changes
Related engineering routes
Continue the workflow
ECAD workspace
Online ECAD schematic editor
Monolith Circuit is a browser-indexable entry point for schematic capture, SPICE-compatible simulation, RF S-parameter inspection, Smith chart work, and component tuning across mobile, tablet, and desktop workflows.
Simulation
SPICE-compatible circuit simulator
Prepare analog circuits for AC and transient analysis, inspect waveforms, add measurements, and tune component values in the Monolith Circuit workflow.
RF analysis
RF S-parameter analysis workspace
Inspect S11, S21, S12, S22, return loss, insertion loss, stability, gain, and marker-driven RF measurements in Monolith Circuit.
Tool directory
RF and analog engineering tools
Browse the Monolith Circuit engineering surface: ECAD schematic editing, SPICE-compatible simulation, RF S-parameter analysis, Smith chart inspection, and component tuning.
FAQ
What is the Smith chart used for here?
It is used to inspect impedance trajectories, reflection behavior, and matching changes.
Does it connect to RF analysis?
Yes. The page is linked to the RF S-parameter workflow.